Discover RAUINSTITUTE OF ENGINEERING AND PHYSICS Department of Microelectronic Circuits and Systems

Head of Department
Professor Vazgen Melikyan, D.Sc., Corresponding Member of the National Academy of Sciences of the Republic of Armenia
Tel: (+374 10) 27-70-52 (251)
Address: 123 Hovsep Emin str.,
Yerevan, 0051 Armenia, office № 254.
The Department of Microelectronic Circuits and Systems was founded in 2007 as a joint initiate of RAU and Synopsys Armenia within the Industry-University cooperation model. The Department supervises the academic programs Design and Technology of Electronic Means and Microelectronic Circuits and Systems. Founded in 1986, Synopsys is a leader in electronic design automation (EDA), supplying the global electronics market with the software, IP and services used in semiconductor design and manufacturing. The 10+ year partnership between Russian-Armenian University and Synopsys Armenia resulted in training top talents who contribute to the engineering workforce of the country.
Academic Programs
The Department offers Bachelor and Master programs:
Design and Technology of Electronic Means
Master's: 11.04.04 Electronics and Nanoelectronics
Microelectronic Circuits and Systems
In addition to State Diplomas (Russian and Armenian), program graduates receive Synopsys Certificates.
University-Industry Model
RAU provides:
  • Classrooms, laboratories
  • Hardware
  • Students from Bachelor program
  • Professors
Synopsys Armenia provides:
  • Industry-leading Synopsys EDA tools
  • Curriculum
  • 1 Professorship
  • Professors’ training
  • Professors
Students of the Department get the opportunity to obtain practical knowledge of design of digital and analog microelectronic facilities, logical design of electronic facilities, etc.  
Research Interests
  • IC Design, Based on FinFET
  • Development of Means for Matching Digital Circuits with Different Clock Frequencies
  • Research and Development of Means of Transmitter and Receiver Working Modes Stabilization
  • Development of Influence Compensation Methods of Integrated Circuit Operating Condition Variations